KLA-Tencor unveils next-generation e-beam inspection system to accelerate transistor innovation at 6
Le 03 Février 2006 à 06 h 56 - Digitimes
KLA-Tencor on February 2 (in the US) introduced the eS32 – an extension of its e-beam inspection platform that the company is hoping will help accelerate transistor innovation at the 65- and 45nm nodes. The announcement indicated that volume shipments of the eS32 are underway.